Volume 5, Issue 2 (International Journal of Optics and Photonics (IJOP) Vol 5, No 2, Summer-Fall 2011)                   IJOP 2011, 5(2): 79-86 | Back to browse issues page

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Rahman F, Podder J, Ichimura M. Studies on Structural and Optical Characterization of In-Zn-S Ternary Thin Films Prepared by Spray Pyrolysis. IJOP 2011; 5 (2) :79-86
URL: http://ijop.ir/article-1-80-en.html
Studies on Structural and Optical Characterization of In-Zn-S Ternary Thin Films Prepared by Spray Pyrolysis
F. Rahman1 , J. Podder * 1, M. Ichimura2
1- Department of Physics, Bangladesh University of Engineering and Technology, Dhaka-1000, Bangladesh
2- Department of Electrical and Electronic Engineering, Nagoya Institute of Technology, Nagoya-466-8555, Japan
Abstract:   (6036 Views)
Thin films of indium doped zinc sulfide (ZnS) for different indium (In) concentrations (x=0.0 - 0.8) were deposited onto glass substrate by spray pyrolysis method at 523K temperature. Aqueous solution of zinc acetate, indium chloride and thiorea were used to deposit the In-Zn-S film. The deposited thin films were characterized by Energy dispersive X-ray (EDX), Scanning electron microscopy (SEM), X-ray diffraction (XRD), and by UVvisible spectroscopy. The XRD spectra of In-Zn- S revealed both the amorphous and polycrystalline property for different In concentration. The EDX showed a well stoichiometric result of different compositions of In in ZnS thin films. The granularity of irregular shape is observed in In doped ZnS thin films surface by scanning electron microscope. From the absorbance and transmittance data it is observed that the band gap energy is decreased from 3.75eV to 3.1eV with the increase of In concentration in ZnS.
Keywords: Spray pyrolysis, In-Zn-S, Thin films, EDX, SEM, Optical properties, Band gap.
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Type of Study: Research | Subject: General
Received: 2013/06/19 | Revised: 2015/03/10 | Accepted: 2015/03/10 | Published: 2015/03/10
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