Showing 2 results for Xrd
Hojjat Amrollahi Bioki, Mahmood Borhani Zarandi,
Volume 5, Issue 2 (7-2011)
Abstract
Zinc Sulfide (ZnS) thin films were deposited on glass substrates at the pressure of 10-6 mbar by thermal resistor evaporation technique. The effects of annealing on the structural, optical properties of ZnS films were studied. Crystalline ZnS films have been analyzed by X-ray diffraction. Only cubic phase with the preferred (111) plane was found in ZnS films. Optical characteristics were studied as a function of annealing temperature and thickness in air. The results show that the energy band gap was found to be about 3.5 eV. It was observed that the energy gap decreases with the increase in the film thickness and increases with the increase in the annealing temperature.
Prof. Rasoul Malekfar, Mr. Akbar Cheraghi,
Volume 8, Issue 1 (1-2014)
Abstract
Nanocrystallite α-cordierite glass-ceramics are synthesized using a modified Pechini method. The structural and lattice modes of the products are investigated via XRD and Micro Raman back-scattering spectroscopy. The Debye-Scherrer formula is used to confirm the grain sizes estimated by the SEM slides. Dielectric coefficients calculation and DTA analysis are used to study the synthesized nanocrystallites properties.
