<?xml version="1.0" encoding="utf-8"?>
<journal>
<title>International Journal of Optics and Photonics</title>
<title_fa></title_fa>
<short_title>IJOP</short_title>
<subject>Basic Sciences</subject>
<web_url>http://ijop.ir</web_url>
<journal_hbi_system_id>1</journal_hbi_system_id>
<journal_hbi_system_user>admin</journal_hbi_system_user>
<journal_id_issn>1735-8590</journal_id_issn>
<journal_id_issn_online>2538-4007</journal_id_issn_online>
<journal_id_pii></journal_id_pii>
<journal_id_doi>10.61186/ijop</journal_id_doi>
<journal_id_iranmedex></journal_id_iranmedex>
<journal_id_magiran></journal_id_magiran>
<journal_id_sid></journal_id_sid>
<journal_id_nlai>1735-8590</journal_id_nlai>
<journal_id_science></journal_id_science>
<language>en</language>
<pubdate>
	<type>jalali</type>
	<year>1390</year>
	<month>4</month>
	<day>1</day>
</pubdate>
<pubdate>
	<type>gregorian</type>
	<year>2011</year>
	<month>7</month>
	<day>1</day>
</pubdate>
<volume>5</volume>
<number>2</number>
<publish_type>online</publish_type>
<publish_edition>1</publish_edition>
<article_type>fulltext</article_type>
<articleset>
	<article>


	<language>en</language>
	<article_id_doi></article_id_doi>
	<title_fa></title_fa>
	<title>Studies on Structural and Optical Characterization of In-Zn-S Ternary Thin Films Prepared by Spray Pyrolysis</title>
	<subject_fa>عمومى</subject_fa>
	<subject>General</subject>
	<content_type_fa>پژوهشي</content_type_fa>
	<content_type>Research</content_type>
	<abstract_fa></abstract_fa>
	<abstract>Thin films of indium doped zinc sulfide (ZnS) for different indium (In) concentrations (x=0.0 - 0.8) were deposited onto glass substrate by spray pyrolysis method at 523K temperature. Aqueous solution of zinc acetate, indium chloride and thiorea were used to deposit the In-Zn-S film. The deposited thin films were characterized by Energy dispersive X-ray (EDX), Scanning electron microscopy (SEM), X-ray diffraction (XRD), and by UVvisible spectroscopy. The XRD spectra of In-Zn- S revealed both the amorphous and polycrystalline property for different In concentration. The EDX showed a well stoichiometric result of different compositions of In in ZnS thin films. The granularity of irregular shape is observed in In doped ZnS thin films surface by scanning electron microscope. From the absorbance and transmittance data it is observed that the band gap energy is decreased from 3.75eV to 3.1eV with the increase of In concentration in ZnS.</abstract>
	<keyword_fa></keyword_fa>
	<keyword>Spray pyrolysis, In-Zn-S, Thin films, EDX, SEM, Optical properties, Band gap.</keyword>
	<start_page>79</start_page>
	<end_page>86</end_page>
	<web_url>http://ijop.ir/browse.php?a_code=A-10-185-1&amp;slc_lang=en&amp;sid=1</web_url>


<author_list>
	<author>
	<first_name>F.</first_name>
	<middle_name></middle_name>
	<last_name>Rahman</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email></email>
	<code>10031947532846001129</code>
	<orcid>10031947532846001129</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of Physics, Bangladesh University of Engineering and Technology, Dhaka-1000, Bangladesh</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>J.</first_name>
	<middle_name></middle_name>
	<last_name>Podder</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email>jpodder@phy.buet.ac.bd</email>
	<code>10031947532846001130</code>
	<orcid>10031947532846001130</orcid>
	<coreauthor>Yes
</coreauthor>
	<affiliation>Department of Physics, Bangladesh University of Engineering and Technology, Dhaka-1000, Bangladesh</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


	<author>
	<first_name>M.</first_name>
	<middle_name></middle_name>
	<last_name>Ichimura</last_name>
	<suffix></suffix>
	<first_name_fa></first_name_fa>
	<middle_name_fa></middle_name_fa>
	<last_name_fa></last_name_fa>
	<suffix_fa></suffix_fa>
	<email></email>
	<code>10031947532846001131</code>
	<orcid>10031947532846001131</orcid>
	<coreauthor>No</coreauthor>
	<affiliation>Department of Electrical and Electronic Engineering, Nagoya Institute of Technology, Nagoya-466-8555, Japan</affiliation>
	<affiliation_fa></affiliation_fa>
	 </author>


</author_list>


	</article>
</articleset>
</journal>
