Volume 5, Issue 2 (International Journal of Optics and Photonics (IJOP) Vol 5, No 2, Summer-Fall 2011)                   IJOP 2011, 5(2): 121-128 | Back to browse issues page

XML Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Amrollahi Bioki H, Borhani Zarandi M. Effects of Annealing and Thickness on the Structural and Optical Properties of Crystalline ZnS Thin Films Prepared by PVD Method. IJOP. 2011; 5 (2) :121-128
URL: http://ijop.ir/article-1-93-en.html

Department of Physics, University of Yazd
Abstract:   (1373 Views)
Zinc Sulfide (ZnS) thin films were deposited on glass substrates at the pressure of 10-6 mbar by thermal resistor evaporation technique. The effects of annealing on the structural, optical properties of ZnS films were studied. Crystalline ZnS films have been analyzed by X-ray diffraction. Only cubic phase with the preferred (111) plane was found in ZnS films. Optical characteristics were studied as a function of annealing temperature and thickness in air. The results show that the energy band gap was found to be about 3.5 eV. It was observed that the energy gap decreases with the increase in the film thickness and increases with the increase in the annealing temperature.
Full-Text [PDF 312 kb]   (857 Downloads)    
Type of Study: Research | Subject: General
Received: 2013/06/20 | Accepted: 2015/03/10 | Published: 2015/03/10

Add your comments about this article : Your username or Email:
Write the security code in the box

© 2015 All Rights Reserved | International Journal of Optics and Photonics

Designed & Developed by : Yektaweb